外尔半金属Co3Sn2S2薄膜的制备和电磁性质研究

外尔半金属Co₃Sn₂S₂薄膜的制备和电磁性质研究

李首翰, 崔驰, 李威, 杨燚, 黄润生

Thin film preparation and electromagnetic properties of Weyl semi⁃metallic Co₃Sn₂S₂

Shouhan Li, Chi Cui, Wei Li, Yi Yang, Runsheng Huang

表2 Al₂O₃(0001)衬底上生长的Co₃Sn₂S₂厚膜的XRD峰的2θ角、d值、晶面指数和相对强度

Table 2 The crystal plane 2θ angle,d value,relative intensity,index of the XRD peak of Co₃Sn₂S₂ thick film grown on Al₂O₃(0001) substrate

2θ (degree)	d (Å)	I	(hkl)
20.13	4.4074	2.0	(003)
23.418	3.7955	48.0	(012)
33.332	2.6858	23.0	(104)
39.369	2.2868	11.2	(015)
41.029	2.198	9.9	(006)
47.876	1.8984	100.0	(024)
52.407	1.7444	2.4	(107)
53.925	1.6989	6.2	(116)
59.598	1.55	3.4	(018)