外尔半金属Co3Sn2S2薄膜的制备和电磁性质研究

李首翰, 崔驰, 李威, 杨燚, 黄润生

Thin film preparation and electromagnetic properties of Weyl semi⁃metallic Co3Sn2S2

Shouhan Li, Chi Cui, Wei Li, Yi Yang, Runsheng Huang

图1 SiO2(300 nm)/Si(100)衬底上Co3Sn2S2厚膜(~5 μm)的XRD谱和文献[13]中Co3Sn2S2粉末的XRD谱

Fig.1 Co3Sn2S2 thick film (~5 μm) XRD spectrum on SiO2 (300 nm)/Si(100) substrate and Co3Sn2S2 powder XRD spectrum[13]