基于注意力机制和多尺度特征融合的绝缘子缺陷检测方法
Insulator defect detection method based on attention mechanism and multi⁃scale feature fusion
基于注意力机制和多尺度特征融合的绝缘子缺陷检测方法 |
| 马学森, 马吉, 蒋功辉, 许雪梅, 周天保 |
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Insulator defect detection method based on attention mechanism and multi⁃scale feature fusion |
| Xuesen Ma, Ji Ma, Gonghui Jiang, Xuemei Xu, Tianbao Zhou |
| 图7 APID数据集部分图片示例 |
| Fig.7 Examples of the APID dataset images |
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