栅介质材料及尺寸对薄膜晶体管性能影响研究
裴智慧,秦国轩

Investigation on the influence of gate dielectric material and size onthin⁃film transistors performance
Zhihui Pei,Guoxuan Qin
图6 阈值电压和载流子迁移率随着温度的变化曲线
Fig. 6 Curves of threshhold voltage and carrier mobility as a function of temperature